The Ultima IV is a state-of-the-art multipurpose X-ray diffraction (XRD) system. This tool has a multistage goniometer that accommodates powder samples and thin films. The Ultima IV X-ray diffractometer can perform micro-crystalline diffraction, thin-film diffraction, in-plane scattering for minerals, ceramics, film, pharmaceuticals, and other powdered materials. Besides, standard diffraction scan, this tool can perform thin-film reflectivity measurements to determine the density, roughness, interface roughness of multilayer thin films.
Please use the Facility Online Manager for instrument signup.