The optical profiler is a non-contact method to measure surface topography of a sample. The topology range may vary from nanometer- to millimeter-scale, with sub-nanometer resolution. This interferometry system provides fast measurement acquisition (seconds) over large sample areas.
![](https://msei.missouri.edu/wp-content/uploads/2022/03/Optical-Profilometer-Vecco-NT-9109-Full.jpg)