Optical Profilometer, Vecco NT 9109

Optical Profiler measures surface topography from nanometer-scale roughness through millimeter-scale steps, with an unmatched combination of sub-nanometer resolution. This interferometry system provides the most precise, 3D surface metrology. Sub-nanometer resolution for roughness analysis of super-smooth surfaces; fast measurement acquisition over large lateral areas.

Please use the Facility Online Manager for instrument signup.