Keithley 4200 SCS Semiconductor Parameter Analyzer and Janis ST-500 Cryogenic Probe Station

The Keithley 4200-SCS is a robust electrical analysis station. The fully integrated parameter analyzer performs extensive electrical characterization of materials and devices at temperatures ranging from 80 K to 475 K. Characterization functions range from basic I-V (current – voltage) and C-V (capacitance – voltage) measurement sweeps to advanced ultra-fast pulsed I-V, waveform capture, and transient I-V measurements. For C-V measurement, an HP 4284A precision LCR (inductance, capacitance, and resistance) meter is used. The test frequency scales from 20 Hz to 1 MHz test.

These tools are connected to a Janis ST-500 cryogenic probe station. The sample chamber has four micromanipulated probes (configured with 3 SMUs, source-measure units). One port is dedicated for optical fiber. The temperature of the sample chuck can be varied from 80 K to 475 K with liquid nitrogen and lakeshore 336 Automatic Temperature Controller.

Reserve Equipment