Bruker Innova AFM

The Bruker Innova is available for routine analysis of samples and can probe the topography of the surface using standard tapping and contact modes, The Innova Atomic Force Microscope delivers accurate, high-resolution imaging and a wide range of functionality for advanced research in physical and material sciences. This unit has the Lowest Noise and Highest Resolution AFM in its Class.

Please use the Facility Online Manager for instrument signup.