The Hysitron TI980 Triboindenter characterizes the mechanical properties of surfaces and thin films. This instrument can measure mechanical properties including Young’s modulus, hardness, and fracture toughness. The system can be run in a quasi-static mode or in a dynamic mode to obtain depth-profiling and viscoelastic properties. The Hysitron XPM system allows users to indent up to 500x faster than conventional measurements. The system can characterize tribology using lateral force measurement. The patented capacitive transducer technology allows for a high displacement sensitivity and a low thermal drift. Users can select standard load or high load transducer to characterize their samples.
